UNC College of Arts & Sciences

Geological Sciences

SEM (scanning electron microscope)

Scanning Electron Microscopy

The scanning electron microscope (SEM) laboratory consists of a Tescan SEM with semi-quantitative EDS capabilities, and an Cressington automated sputter coater. The X-ray analysis system was recently upgraded to a silicon drift detector with a 4pi analyzer and software, using funds from Dr. John J.W Rogers and the University.

SEM Calendar (click to access the calendar for sign-ups)



 

For additional information about the SEM facilities, or for information on obtaining analyses of samples, please contact:

Dr. Drew Coleman
Department of Geological Sciences
325 Mitchell Hall, CB#3315
University of North Carolina
Chapel Hill, NC 27599-3315
email: dcoleman at email dot unc.edu
telephone: (919) 962-0705
fax: (919) 966-4519

Copyright © 2009 Department of Geological Sciences, University of North Carolina, Chapel Hill. University Web Design by New Media Campaigns

104 South Road, Mitchell Hall
Campus Box #3315
Chapel Hill, NC 27599-3315
Telephone: (919) 966-4516
Fax: (919) 966-4519